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1. Zork: a type-checker for Z from York
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【来源】
[外文会议]
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【作者】
Toyn, I. McDermid, J.A. Institute of Electric and Electronic Engineer
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【摘要】
Z specifications have been written at York for some years. However, the tool support was minimal: some troff macros to draw schema boxes, and fancy characters that were formed by overlaying existing c...
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2. Zero-voltage-switching PWM inverter for high-frequency DC-AC power conversion
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【来源】
[外文会议]
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【作者】
He, J. Mohan, N. Institute of Electric and Electronic Engineer
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【摘要】
A zero voltage switching (ZVS) pulse-width modulation (PWM) inverter that uses a parallel-resonant DC link (PRDCL) circuit is examined. The PRDCL circuit provides zero-DC link voltage periods for the ...
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3. Zero-sequence impedance of overhead transmission lines with discontinuous ground wire
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【来源】
[外文会议]
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【作者】
Thapar, B. Gerez, V. Institute of Electric and Electronic Engineer
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【摘要】
The authors give a method to calculate the zero-sequence impedance of a transmission line having ground wires that are not continuous or are not connected to the station grounds at the end of the line...
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4. Zero-crossing technique for clock-transition detection in a Rb frequency standard
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【来源】
[外文会议]
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【作者】
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【摘要】
A technique for detection of the clock-transition, in an Rb frequency standard, by means of magnetic field modulation is proposed. In this technique the microwave frequency is held constant and the ma...
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5. Zero voltage switching AC/DC/AC converter using modified high frequency DC-link
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【来源】
[外文会议]
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【作者】
Byeong-Ok Woo In-Dong Kim Institute of Electric and Electronic Engineer
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【摘要】
A power converter that is based on high-frequency links, uses unidirectional switches and operates in the zero voltage switching mode is described. It is shown that the converter's reactive elements s...
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6. Zero modules for systems over rings
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【来源】
[外文会议]
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【作者】
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【摘要】
This study centers on some of the results given by F. Bostwick et al. (J. Control Optim., vol.25, no.1, p.86-99, Jan. 1987) which connect zeros of the Rosenbrock system matrix with zeros of the transf...
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7. Zero dynamics in kinematically redundant robots
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【来源】
[外文会议]
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【作者】
Varghese, M. Fuchs, A. Institute of Electric and Electronic Engineer
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【摘要】
The integration of the control of kinematically redundant robots and feedback linearization is discussed. Cases of feedback linearization are analyzed when the decoupling matrix is nonsquare-in partic...
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8. Zero defects or zero stuck-at faults-CMOS IC process improvement with I/sub DDQ/
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【来源】
[外文会议]
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【作者】
Soden, J.M. Fritzemeier, R.R. Institute of Electric and Electronic Engineer
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【摘要】
The authors suggest that continuous quality improvement with the goal of zero defects requires a physical defect metric which goes beyond 100% SAF (stuck-at-fault) coverage. It is further suggested th...
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9. You Can't Drink And Whistle At The Same Time
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【来源】
[外文会议]
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【作者】
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【摘要】
No abstract
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10. You can meet tomorrow's challenges with today's training strategies (logistics management system)
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【来源】
[外文会议]
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【作者】
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【摘要】
It is pointed out that the training department must participate in the total automated data system (ADS) project life cycle to achieve optimum document quality and cost effectiveness. Of the five phas...
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11. Yield modeling in a custom IC manufacturing line
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【来源】
[外文会议]
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【作者】
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【摘要】
A methodology used to implement yield modeling in a custom integrated-circuit manufacturing facility is described. The sources for the inputs to the models are described. The component approach to yie...
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12. Yield modeling from SRAM failure analysis
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【来源】
[外文会议]
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【作者】
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【摘要】
Yield models based on Poisson, bose-Einstein, and binomial statistics are compared for a 1.25 mu m CMOS process. A mixed binomial yield model is shown to most accurately describe experimental yield da...
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13. Yield modeling for fault tolerant WSI arrays
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【来源】
[外文会议]
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【作者】
Tyagi, A. Bayoumi, M.A. Institute of Electric and Electronic Engineer
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【摘要】
An approach to modeling the yield of WSI architectures in view of spatial distribution of defects on a wafer and varying clustering parameter alpha is proposed. The results are mapped onto two-dimensi...
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14. Yield improvement in silicon epitaxy through gas purity analysis and control at the wafer
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【来源】
[外文会议]
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【作者】
Smoak, B.C., Jr O'Ferrell, D.S. Brestovansky, D. Cheung, S.D.
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【摘要】
The characterization of an Applied Materials 7600 silicon epi reactor using a reactor analysis system is described. By analyzing gaseous impurities such as oxygen, moisture (H/sub 2/O), and particulat...
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15. Yet another multiplier architecture
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【来源】
[外文会议]
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【作者】
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【摘要】
The VLSI multiplier architecture discussed makes advances over previous architectures in terms of layout density and flexibility in making speed/size tradeoffs. This multiplier design and a ripple add...
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16. Yet another multiplier architecture
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【来源】
[外文会议]
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【作者】
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【摘要】
The VLSI multiplier architecture discussed makes advances over previous architectures in terms of layout density and flexibility in making speed/size tradeoffs. This multiplier design and a ripple add...
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17. Yet another multiplier architecture
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【来源】
[外文会议]
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【作者】
Stearns, C.C. Ang, P.H. Institute of Electric and Electronic Engineer
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【摘要】
The VLSI multiplier architecture discussed makes advances over previous architectures in terms of layout density and flexibility in making speed/size tradeoffs. This multiplier design and a ripple add...
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18. Yet another multiplier architecture
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【来源】
[外文会议]
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【作者】
Stearns, C.C. Ang, P.H. Institute of Electric and Electronic Engineer
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【摘要】
The VLSI multiplier architecture discussed makes advances over previous architectures in terms of layout density and flexibility in making speed/size tradeoffs. This multiplier design and a ripple add...
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19. Yet another approach to statistical circuit design-stochastic minimax
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【来源】
[外文会议]
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【作者】
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【摘要】
A formulation of the statistical design centering (SDC) problem of electronic circuits is presented. The income index optimization problem formulation, introduced by L.J. Opalski and M.A. Styblinski (...
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20. YBa/sub 2/Cu/sub 3/O/sub 6-x/-based thick film resistor
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【来源】
[外文会议]
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【作者】
Fu Shen-Li Hsieh, Y.H. Institute of Electric and Electronic Engineer
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【摘要】
Owing to the low resistivity and small positive temperature coefficient of resistivity around room temperature of the YBa/sub 2/Cu/sub 3/O/sub 7-x/ superconductor, thick film resistor paste is prepare...
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