学科筛选

  • 15. X-Ray microanalysis of stratified specimens

  • 【来源】

    [外文期刊]

  • 【作者】

    Jean-Louis Pouchou 

  • 【摘要】

    This paper presents a description of the state of the art methodology and software for the application of x-ray microanalysis to thin surface layers and more generally to the characterization of strat...

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